China Telecom selects Anite for LTE data throughput testing

SAS, Anite’s interoperability and performance test solution, deployed to help accelerate the introduction of new devices to the Chinese market

China Telecom selects Anite for LTE data throughput testing

Anite, the wireless equipment testing technology provider, has announced that China Telecom has selected its interoperability and performance test solution – SAS – for LTE data throughput testing. China Telecom will use the solution as a key part of its LTE device acceptance programme.

SAS supports the China Telecom approved test plan which consists of two LTE data throughput packages totalling over 200 scripts. These scripts allow China Telecom and any device manufacturer in their ecosystem to ensure that new devices perform as expected on their mobile network.

China Telecom also uses Anite’s Conformance Toolset as their primary platform for conformance testing enabling them to run a wide range of pre-qualification test scripts from a single platform, leading to accelerated product releases.

When a mobile operator and device manufacturer use SAS together to run approved mobile operator test plans, more consistent results can be achieved. Devices can be tested more accurately and rigorously through straightforward replication of a wide range of test scenarios specified by the mobile operator.

This means reduced risk of device rejection and accelerated time to market. Lab-based device testing is quicker, more reliable and more cost-effective than device testing conducted solely in the field.

Paul Beaver, products director at Anite’s Device & Infrastructure Testing business commented: “We are delighted to have been selected by China Telecom for LTE data throughput testing. Anite’s range of leading device test solutions enable mobile operators like China Telecom to cost-effectively and quickly verify and launch new devices to market.

A number of other major mobile operators in China, US and Europe use Anite’s interoperability and performance test solution for rapid verification of new devices.”

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